Granted Patent
Utility
US 4,293,950 · App. 06/026,246
Test pattern generating apparatus
Inventors:
Masao Shimizu, Takashi Tokuno, Kohji Ishikawa, Naoaki Narumi, Osamu Ohguchi
Patented Case
View Patent ↗
Granted: Oct 6, 1981
Filed: Apr 2, 1979
Inventors
Masao Shimizu
Takashi Tokuno
Kohji Ishikawa
Naoaki Narumi
Osamu Ohguchi
Assignees (at issue)
Nippon Telegraph and Telephone Public Corporation
Takeda Riken Kogyo Kabushikikaisha
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.