IP Library Granted Patent US 4,336,496
Granted Patent Utility
US 4,336,496 · App. 06/193,176

Electrical contact test apparatus to test contact resistance of a sample terminal

Inventors: Rudolf Schnabl, Helmut Becker
Patented Case View Patent ↗
Granted: Jun 22, 1982 Filed: Oct 1, 1980
Inventors
Rudolf Schnabl
Helmut Becker
Assignee (at issue)
W. C. Heraeus GmbH

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Quick Facts
Patent No.
US 4,336,496
App. No.
06/193,176
Filed
1980-10-01
Granted
1982-06-22
Kind
A