Granted Patent
Utility
US 4,429,047 · App. 06/297,176
Method for determining oxygen content in semiconductor material
Inventors:
Lubomir L. Jastrzebski, Jacek Lagowski
Patented Case
View Patent ↗
Granted: Jan 31, 1984
Filed: Aug 28, 1981
Inventors
Lubomir L. Jastrzebski
Jacek Lagowski
Assignee (at issue)
RCA Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.