IP Library Granted Patent US 4,430,571
Granted Patent Utility
US 4,430,571 · App. 06/254,870

Method and apparatus for exposing multi-level registered patterns interchangeably between stations of a multi-station electron-beam array lithography (EBAL) system

Inventors: Donald O. Smith, Kenneth J. Harte
Patented Case View Patent ↗
Granted: Feb 7, 1984 Filed: Apr 16, 1981
Inventors
Donald O. Smith
Kenneth J. Harte
Assignee (at issue)
Control Data Corporation

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Quick Facts
Patent No.
US 4,430,571
App. No.
06/254,870
Filed
1981-04-16
Granted
1984-02-07
Kind
A