IP Library Granted Patent US 4,457,625
Granted Patent Utility
US 4,457,625 · App. 06/282,552

Self calibrating contour measuring system using fringe counting interferometers

Inventors: Allen H. Greenleaf, John T. Watson
Patented Case View Patent ↗
Granted: Jul 3, 1984 Filed: Jul 13, 1981
Inventors
Allen H. Greenleaf
John T. Watson
Assignee (at issue)
I-TEK, Inc.

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Quick Facts
Patent No.
US 4,457,625
App. No.
06/282,552
Filed
1981-07-13
Granted
1984-07-03
Kind
A