Granted Patent
Utility
US 4,472,738 · App. 06/381,469
Pattern testing apparatus
Inventors:
Kazunari Hada, Norio Fujii, Atsushi Kawahara, Toru Azuma, Junji Hazama
Patented Case
View Patent ↗
Granted: Sep 18, 1984
Filed: May 24, 1982
Inventors
Kazunari Hada
Norio Fujii
Atsushi Kawahara
Toru Azuma
Junji Hazama
Assignee (at issue)
Nippon Kogaku K.K.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.