Granted Patent
Utility
US 4,474,640 · App. 06/326,301
In situ differential thermal analysis for HgCdTe LPE
Inventor:
Chang-Feng Wan
Patented Case
View Patent ↗
Granted: Oct 2, 1984
Filed: Dec 1, 1981
Inventor
Chang-Feng Wan
Assignee (at issue)
Texas Instruments Incorporated
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.