Granted Patent
Utility
US 4,498,045 · App. 06/382,426
Apparatus and method for determining surface contour of piezoelectric wafers
Inventor:
Lawrence N. Dworsky
Patented Case
View Patent ↗
Granted: Feb 5, 1985
Filed: May 27, 1982
Inventor
Lawrence N. Dworsky
Assignee (at issue)
Motorola, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.