Granted Patent
Utility
US 4,499,640 · App. 06/411,524
Method of manufacturing capacitance-type material level indicator probe
Inventors:
Ronald G. Brenton, Robin B. Runck
Patented Case
View Patent ↗
Granted: Feb 19, 1985
Filed: Aug 25, 1982
Inventors
Ronald G. Brenton
Robin B. Runck
Assignee (at issue)
Berwind Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.