Granted Patent
Utility
US 4,499,641 · App. 06/419,776
Method of manufacturing capacitance-type material level indicator probe
Inventor:
Phillip P. Fleckenstein
Patented Case
View Patent ↗
Granted: Feb 19, 1985
Filed: Sep 20, 1982
Inventor
Phillip P. Fleckenstein
Assignee (at issue)
Berwind Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.