Granted Patent
Utility
US 4,515,475 · App. 06/308,542
Measurement of refractive index profile
Inventors:
David Neil Payne, Issei Sasaki, Michael J. Adams
Patented Case
View Patent ↗
Granted: May 7, 1985
Filed: Oct 1, 1981
Inventors
David Neil Payne
Issei Sasaki
Michael J. Adams
Assignee (at issue)
NATIONAL RESEARCH DEVELOPMENT CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.