Granted Patent
Utility
US 4,515,484 · App. 06/561,697
Temperature testing apparatus for an electronic circuit substrate
Inventor:
James H. Gilley
Patented Case
View Patent ↗
Granted: May 7, 1985
Filed: Dec 15, 1983
Inventor
James H. Gilley
Assignee (at issue)
AT&T Technologies Incorporated
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.