Granted Patent
Utility
US 4,520,313 · App. 06/363,641
Semiconductor testing and apparatus therefor
Inventors:
Laurence L. Allred, Jr., Bradley N. Lange
Patented Case
View Patent ↗
Granted: May 28, 1985
Filed: Mar 30, 1982
Inventors
Laurence L. Allred, Jr.
Bradley N. Lange
Assignee (at issue)
Advanced Semiconductor Materials America, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.