IP Library Granted Patent US 4,575,676
Granted Patent Utility
US 4,575,676 · App. 06/481,772

Method and apparatus for radiation testing of electron devices

Inventor: Leslie J. Palkuti
Patented Case View Patent ↗
Granted: Mar 11, 1986 Filed: Apr 4, 1983
Inventor
Leslie J. Palkuti
Assignee (at issue)
Advanced Research and Applications Corporation

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Quick Facts
Patent No.
US 4,575,676
App. No.
06/481,772
Filed
1983-04-04
Granted
1986-03-11
Kind
A