Granted Patent
Utility
US 4,575,922 · App. 06/668,512
Method of fabricating integrated circuits incorporating steps to detect presence of gettering sites
Inventor:
Michael H. Nemiroff
Patented Case
View Patent ↗
Granted: Mar 18, 1986
Filed: Nov 5, 1984
Inventor
Michael H. Nemiroff
Assignee (at issue)
Burroughs, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.