Granted Patent
Utility
US 4,588,945 · App. 06/503,465
High throughput circuit tester and test technique avoiding overdriving damage
Inventors:
William A. Groves, Vance R. Harwood, Thomas FAY, Elton C. Bingham, Michael A. Teska
Patented Case
View Patent ↗
Granted: May 13, 1986
Filed: Jun 13, 1983
Inventors
William A. Groves
Vance R. Harwood
Thomas FAY
Elton C. Bingham
Michael A. Teska
Assignee (at issue)
Hewlett-Packard Company, L.P.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.