Granted Patent
Utility
US 4,594,711 · App. 06/551,667
Universal testing circuit and method
Inventor:
Satish M. Thatte
Patented Case
View Patent ↗
Granted: Jun 10, 1986
Filed: Nov 10, 1983
Inventor
Satish M. Thatte
Assignee (at issue)
Texas Instruments Incorporated
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.