Granted Patent
Utility
US 4,598,249 · App. 06/584,814
Method using surface photovoltage (SPV) measurements for revealing heavy metal contamination of semiconductor material
Inventors:
Lawrence A. Goodman, Alvin M. Goodman, Herman F. Gossenberger
Patented Case
View Patent ↗
Granted: Jul 1, 1986
Filed: Feb 29, 1984
Inventors
Lawrence A. Goodman
Alvin M. Goodman
Herman F. Gossenberger
Assignee (at issue)
RCA Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.