Granted Patent
Utility
US 4,602,210 · App. 06/687,357
Multiplexed-access scan testable integrated circuit
Inventors:
Patrick P. Fasang, John Shen
Patented Case
View Patent ↗
Granted: Jul 22, 1986
Filed: Dec 28, 1984
Inventors
Patrick P. Fasang
John Shen
Assignee (at issue)
General Electric Company
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.