Granted Patent
Utility
US 4,602,272 · App. 06/670,605
Electron beam intensity profile measuring system and method
Inventor:
Robert A. Duschl
Patented Case
View Patent ↗
Granted: Jul 22, 1986
Filed: Nov 13, 1984
Inventor
Robert A. Duschl
Assignee (at issue)
RCA Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.