Granted Patent
Utility
US 4,607,219 · App. 06/530,667
Method of inspecting semiconductor non-volatile memory devices
Inventor:
Shigekazu Isosaka
Patented Case
View Patent ↗
Granted: Aug 19, 1986
Filed: Sep 9, 1983
Inventor
Shigekazu Isosaka
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.