IP Library Granted Patent US 4,636,719
Granted Patent Utility
US 4,636,719 · App. 06/667,355

Apparatus for extended precision phase measurement

Inventors: David Michael Zuk, Vernon L. Larrowe
Patented Case View Patent ↗
Granted: Jan 13, 1987 Filed: Nov 1, 1984
Inventors
David Michael Zuk
Vernon L. Larrowe
Assignee (at issue)
Environmental Research Institute

This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.

Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 4,636,719
App. No.
06/667,355
Filed
1984-11-01
Granted
1987-01-13
Kind
A