Granted Patent
Utility
US 4,698,589 · App. 06/842,267
Test circuitry for testing fuse link programmable memory devices
Inventors:
Timothy L. Blankenship, Joseph G. Nolan, III
Patented Case
View Patent ↗
Granted: Oct 6, 1987
Filed: Mar 21, 1986
Inventors
Timothy L. Blankenship
Joseph G. Nolan, III
Assignee (at issue)
HARRIS CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.