Granted Patent
Utility
US 4,706,019 · App. 06/798,592
Electron beam test probe system for analyzing integrated circuits
Inventor:
Neil Richardson
Patented Case
View Patent ↗
Granted: Nov 10, 1987
Filed: Nov 15, 1985
Inventor
Neil Richardson
Assignee (at issue)
Fairchild Camera & Instrument Corp.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.