Granted Patent
Utility
US 4,707,137 · App. 06/791,421
Device and method for testing the wave front quality of optical components
Inventor:
Wai-Hon Lee
Patented Case
View Patent ↗
Granted: Nov 17, 1987
Filed: Oct 25, 1985
Inventor
Wai-Hon Lee
Assignee (at issue)
Laser Magnetic Storage International Company
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.