Granted Patent
Utility
US 4,758,728 · App. 06/813,149
Method of measuring mask misregistry in kinescope panel assemblies
Inventors:
James R. Matey, David P. Bortfeld
Patented Case
View Patent ↗
Granted: Jul 19, 1988
Filed: Dec 24, 1985
Inventors
James R. Matey
David P. Bortfeld
Assignee (at issue)
RCA Licensing Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.