Granted Patent
Utility
US 4,765,189 · App. 06/936,430
Optical system for in-plane strain measurement using electronics speckle pattern interferometry
Inventor:
Richard W. T. Preater
Patented Case
View Patent ↗
Granted: Aug 23, 1988
Filed: Dec 1, 1986
Inventor
Richard W. T. Preater
Assignee (at issue)
NATIONAL RESEARCH DEVELOPMENT CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.