Granted Patent
Utility
US 4,794,264 · App. 07/047,888
Surface defect detection and confirmation system and method
Inventors:
George S. Quackenbos, Jay Ormsby, Eric Chase, Sergey V. Broude, Koichi Nishine
Patented Case
View Patent ↗
Granted: Dec 27, 1988
Filed: May 8, 1987
Inventors
George S. Quackenbos
Jay Ormsby
Eric Chase
Sergey V. Broude
Koichi Nishine
Assignee (at issue)
QC Optics, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.