Granted Patent
Utility
US 4,816,753 · App. 07/053,104
Method for reliability testing of integrated circuits
Inventor:
Leslie J. Palkuti
Patented Case
View Patent ↗
Granted: Mar 28, 1989
Filed: May 21, 1987
Inventor
Leslie J. Palkuti
Assignee (at issue)
Advanced Research and Applications Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.