IP Library Granted Patent US 4,845,769
Granted Patent Utility
US 4,845,769 · App. 06/819,655

Annular x-ray inspection system

Inventors: Paul Burstein, Allen S. Krieger
Patented Case View Patent ↗
Granted: Jul 4, 1989 Filed: Jan 17, 1986
Inventors
Paul Burstein
Allen S. Krieger
Assignee (at issue)
American Science and Engineering, Inc.

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Quick Facts
Patent No.
US 4,845,769
App. No.
06/819,655
Filed
1986-01-17
Granted
1989-07-04
Kind
A