Granted Patent
Utility
US 4,855,672 · App. 07/051,888
Method and process for testing the reliability of integrated circuit (IC) chips and novel IC circuitry for accomplishing same
Inventor:
Robert W. Shreeve
Patented Case
View Patent ↗
Granted: Aug 8, 1989
Filed: May 18, 1987
Inventor
Robert W. Shreeve
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.