Granted Patent
Utility
US 4,870,618 · App. 06/849,630
Semiconductor memory equipped with test circuit for testing data holding characteristic during data programming period
Inventor:
Shinichi Iwashita
Patented Case
View Patent ↗
Granted: Sep 26, 1989
Filed: Apr 9, 1986
Inventor
Shinichi Iwashita
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.