IP Library Granted Patent US 4,885,472
Granted Patent Utility
US 4,885,472 · App. 07/167,601

Silicon grid as a reference and calibration standard in a particle beam lithography system

Inventor: Lydia J. Young
Patented Case View Patent ↗
Granted: Dec 5, 1989 Filed: Mar 14, 1988
Inventor
Lydia J. Young
Assignee (at issue)
PerkinElmer, Inc.

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Quick Facts
Patent No.
US 4,885,472
App. No.
07/167,601
Filed
1988-03-14
Granted
1989-12-05
Kind
A