Granted Patent
Utility
US 4,885,528 · App. 07/318,286
Apparatus which uses a simulated inductor in the measurement of an electrical parameter of a device under test
Inventors:
Hideshi Tanaka, Kazuyuki Yagi, Shigeru Tanimoto, Yasuaki Komatsu, Koichi Yanagawa, Yoichi Kuboyama
Patented Case
View Patent ↗
Granted: Dec 5, 1989
Filed: Mar 3, 1989
Inventors
Hideshi Tanaka
Kazuyuki Yagi
Shigeru Tanimoto
Yasuaki Komatsu
Koichi Yanagawa
Yoichi Kuboyama
Assignee (at issue)
Hewlett-Packard Company, L.P.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.