Granted Patent
Utility
US 4,888,772 · App. 07/066,275
Testing circuit for random access memory device
Inventor:
Takaho Tanigawa
Patented Case
View Patent ↗
Granted: Dec 19, 1989
Filed: Jun 25, 1987
Inventor
Takaho Tanigawa
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.