Granted Patent
Utility
US 4,897,537 · App. 07/173,416
Automatic focus adjusting system of microscope employed in surface inspection apparatus
Inventors:
Seiichi Miyamoto, Yo Tajima, Masaru Maruki, Masaru Hanatani
Patented Case
View Patent ↗
Granted: Jan 30, 1990
Filed: Mar 25, 1988
Inventors
Seiichi Miyamoto
Yo Tajima
Masaru Maruki
Masaru Hanatani
Assignee (at issue)
Kanzaki Paper Manufacturing Co., Ltd.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.