IP Library › Granted Patent US 4,897,817
Granted Patent Utility
US 4,897,817 · App. 07/195,391

Semiconductor memory device with a built-in test circuit

Inventor: Naoki Katanosaka
Patented Case View Patent ↗
Granted: Jan 30, 1990 Filed: May 10, 1988
Inventor
Naoki Katanosaka
Assignee (at issue)
NEC CORPORATION

This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.

Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 4,897,817
App. No.
07/195,391
Filed
1988-05-10
Granted
1990-01-30
Kind
A