Granted Patent
Utility
US 4,918,374 · App. 07/254,269
Method and apparatus for inspecting integrated circuit probe cards
Inventors:
John-Paul M. Stewart, Ronald Seubert, Donald B. Snow
Patented Case
View Patent ↗
Granted: Apr 17, 1990
Filed: Oct 5, 1988
Inventors
John-Paul M. Stewart
Ronald Seubert
Donald B. Snow
Assignee (at issue)
Applied Precision, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.