Granted Patent
Utility
US 4,939,694 · App. 07/377,787
Defect tolerant self-testing self-repairing memory system
Inventors:
Steven Eaton, Lawrence R. Hanlon, Marvin S. Keshner
Patented Case
View Patent ↗
Granted: Jul 3, 1990
Filed: Jul 10, 1989
Inventors
Steven Eaton
Lawrence R. Hanlon
Marvin S. Keshner
Assignee (at issue)
Hewlett-Packard Company, L.P.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.