Granted Patent
Utility
US 4,970,461 · App. 07/371,589
Method and apparatus for non-contact opens/shorts testing of electrical circuits
Inventor:
Andrew J. LePage
Patented Case
View Patent ↗
Granted: Nov 13, 1990
Filed: Jun 26, 1989
Inventor
Andrew J. LePage
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.