Granted Patent
Utility
US 4,987,365 · App. 07/344,885
Method and apparatus for testing integrated circuits
Inventors:
Robert W. Shreeve, B. Dale Atwood
Patented Case
View Patent ↗
Granted: Jan 22, 1991
Filed: Apr 28, 1989
Inventors
Robert W. Shreeve
B. Dale Atwood
Assignee (at issue)
Hewlett-Packard Company, L.P.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.