Granted Patent
Utility
US 5,000,569 · App. 07/291,237
Light reflection defect detection apparatus and method using pulsed light-emitting semiconductor devices of different wavelengths
Inventor:
Steven L. Nylund
Patented Case
View Patent ↗
Granted: Mar 19, 1991
Filed: Dec 28, 1988
Inventor
Steven L. Nylund
Assignee (at issue)
Lamb Weston, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.