Granted Patent
Utility
US 5,057,780 · App. 07/659,532
Method and apparatus for measuring trigger and latchback voltage of a semiconductor device
Inventors:
Hideo Akama, Norio Sone
Patented Case
View Patent ↗
Granted: Oct 15, 1991
Filed: Feb 22, 1991
Inventors
Hideo Akama
Norio Sone
Assignee (at issue)
Hewlett-Packard Company, L.P.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.