Granted Patent
Utility
US 5,101,152 · App. 07/472,926
Integrated circuit transfer test device system utilizing lateral transistors
Inventors:
Vance R. Harwood, Kevin W. Keirn, John J. Keller, Ronald J. Peiffer
Patented Case
View Patent ↗
Granted: Mar 31, 1992
Filed: Jan 31, 1990
Inventors
Vance R. Harwood
Kevin W. Keirn
John J. Keller
Ronald J. Peiffer
Assignee (at issue)
Hewlett-Packard Company, L.P.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.