Granted Patent
Utility
US 5,162,728 · App. 07/580,765
Functional at speed test system for integrated circuits on undiced wafers
Inventor:
Jon M. Huppenthal
Patented Case
View Patent ↗
Granted: Nov 10, 1992
Filed: Sep 11, 1990
Inventor
Jon M. Huppenthal
Assignee (at issue)
Cray Computer Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.