Granted Patent
Utility
US 5,166,604 · App. 07/611,974
Methods and apparatus for facilitating scan testing of asynchronous logic circuitry
Inventors:
Bahram Ahanin, Craig Lytle, Ricky W. Ho
Patented Case
View Patent ↗
Granted: Nov 24, 1992
Filed: Nov 13, 1990
Inventors
Bahram Ahanin
Craig Lytle
Ricky W. Ho
Assignee (at issue)
Altera Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.