IP Library Granted Patent US 5,223,787
Granted Patent Utility
US 5,223,787 · App. 07/890,216

High-speed, low-profile test probe

Inventors: Monty Smith, Garry P. Liddell, James E. Trimble, David Payne
Patented Case View Patent ↗
Granted: Jun 29, 1993 Filed: May 29, 1992
Inventors
Monty Smith
Garry P. Liddell
James E. Trimble
David Payne
Assignee (at issue)
Tektronix, Inc.

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Quick Facts
Patent No.
US 5,223,787
App. No.
07/890,216
Filed
1992-05-29
Granted
1993-06-29
Kind
A