Granted Patent
Utility
US 5,239,270 · App. 07/840,390
Wafer level reliability contact test structure and method
Inventor:
Donald J. Desbiens
Patented Case
View Patent ↗
Granted: Aug 24, 1993
Filed: Feb 24, 1992
Inventor
Donald J. Desbiens
Assignee (at issue)
NATIONAL SEMICONDUCTOR CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.