Granted Patent
Utility
US 5,274,336 · App. 07/820,711
Capacitively-coupled test probe
Inventors:
David T. Crook, John M. Heumann, John E. McDermid, Ronald J. Peiffer, Ed O. Schlotzhauer
Patented Case
View Patent ↗
Granted: Dec 28, 1993
Filed: Jan 14, 1992
Inventors
David T. Crook
John M. Heumann
John E. McDermid
Ronald J. Peiffer
Ed O. Schlotzhauer
Assignee (at issue)
Hewlett-Packard Company, L.P.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.