Granted Patent
Utility
US 5,285,151 · App. 07/854,205
Method and apparatus for measuring the breakdown voltage of semiconductor devices
Inventors:
Hideo Akama, Hiroshi Nada
Patented Case
View Patent ↗
Granted: Feb 8, 1994
Filed: Mar 20, 1992
Inventors
Hideo Akama
Hiroshi Nada
Assignee (at issue)
Hewlett-Packard Company, L.P.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.